✦ LIBER ✦

Analysis of the temperature dependence of hot-carrier-induced degradation in bipolar transistors for Bi-CMOS

✍ Scribed by Momose, H.S.; Iwai, H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Temperature dependence of hot-electron d

✍ Huang, C.-J.; Grotjohn, T.A.; Sun, C.J.; Reinhard, D.K.; Yu, C.-C.W. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 583 KB

Dc and low frequency noise analysis of h

✍ P. Benoit; J. Raoult; C. Delseny; F. Pascal; L. Snadny; J.-C. Vildeuil; M. Marin 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 521 KB

The temperature dependence of mixed mode

✍ G.T. Sasse; M. Combrié 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 464 KB

Voltage dependences of parameter drifts

✍ Shahabuddin, S.; Soin, N.; Goh, K.K.; Abdul Wahab, Y.; Hussin, H. 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 900 KB

Analysis of the temperature dependence o

✍ Ng, C.-M.S.; Houston, P.A.; Ho-Kwang Yow 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 297 KB

Analysis of drain ac stress-induced hot-

✍ Satoshi Inoue; Mutsumi Kimura; Tatsuya Shimoda 📂 Article 📅 2002 🏛 Society for Information Display 🌐 English ⚖ 436 KB