✦ LIBER ✦
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 μm CMOS bipolar transistors
✍ Scribed by P. Benoit; J. Raoult; C. Delseny; F. Pascal; L. Snadny; J.-C. Vildeuil; M. Marin; B. Martinet; D. Cottin; O. Noblanc
- Book ID
- 108210589
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 521 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.