✦ LIBER ✦

Analysis of drain ac stress-induced hot-carrier degradation in low-temperature poly-Si TFTs

✍ Scribed by Satoshi Inoue; Mutsumi Kimura; Tatsuya Shimoda

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hot carrier analysis in low-temperature

✍ Uraoka, Y.; Hirai, N.; Yano, H.; Hatayama, T.; Fuyuki, T. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 731 KB

Investigation of Relationship between Ho

✍ Inoue, Satoshi; Shimoda, Tatsuya 📂 Article 📅 1999 🏛 Wiley (John Wiley & Sons) ⚖ 251 KB

Degradation of n-channel low temperature

✍ Han-Wen Liu; Si-Ming Chiou; Han-Ching Ho; Fang-Hsing Wang 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 475 KB

An investigation of drain pulse induced

✍ Meng Zhang; Mingxiang Wang 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 507 KB

A new self-consistent model for the anal

✍ A. Valletta; L. Mariucci; A. Pecora; G. Fortunato; J.R. Ayres; S.D. Brotherton 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 177 KB

The formation and annealing of hot-carri

✍ Young, N.D. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 703 KB