✦ LIBER ✦

Degradation of n-channel low temperature poly-Si TFTs dynamically stressed in OFF region with positive drain bias

✍ Scribed by Han-Wen Liu; Si-Ming Chiou; Han-Ching Ho; Fang-Hsing Wang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Analysis of drain ac stress-induced hot-

✍ Satoshi Inoue; Mutsumi Kimura; Tatsuya Shimoda 📂 Article 📅 2002 🏛 Society for Information Display 🌐 English ⚖ 436 KB

Drain-Induced Barrier Lowering in Short-

✍ U. G. Lee; J. Jang 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 397 KB

A Two-Stage Degradation Model of p-Chann

✍ Xiaowei Lu; Mingxiang Wang; Man Wong 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 741 KB