✦ LIBER ✦
A new self-consistent model for the analysis of hot-carrier induced degradation in lightly doped drain (LDD) and gate overlapped LDD polysilicon TFTs
✍ Scribed by A. Valletta; L. Mariucci; A. Pecora; G. Fortunato; J.R. Ayres; S.D. Brotherton
- Book ID
- 108388546
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 177 KB
- Volume
- 427
- Category
- Article
- ISSN
- 0040-6090
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