✦ LIBER ✦
The formation and annealing of hot-carrier-induced degradation in poly-Si TFT's, MOSFET's, and SOI devices, and similarities to state-creation in αSi:H
✍ Scribed by Young, N.D.
- Book ID
- 114536447
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 703 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0018-9383
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