𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Temperature dependence of hot-electron degradation in bipolar transistors

✍ Scribed by Huang, C.-J.; Grotjohn, T.A.; Sun, C.J.; Reinhard, D.K.; Yu, C.-C.W.


Book ID
114535225
Publisher
IEEE
Year
1993
Tongue
English
Weight
583 KB
Volume
40
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES