Sputter damage in Si (0 0 1) surface by combination of C60+ and Ar+ ion beams
โ Scribed by Bang-Ying Yu; Wei-Chun Lin; Ying-Yu Chen; Yu-Chin Lin; Ken-Tsung Wong; Jing-Jong Shyue
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 711 KB
- Volume
- 255
- Category
- Article
- ISSN
- 0169-4332
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๐ SIMILAR VOLUMES
The correlation of radiation damage recovery with crystallographic orientation in magnesium oxide (MgO) single crystals during isochronal post-implantation annealing was investigated. Samples of (1 0 0), (1 1 0) and (1 1 1) MgO were implanted with 100 keV Ar + ions at room temperature and annealed i
We measured charge state dependence and incident angle dependence of sputtering yields and two-dimensional (2D) position distributions for H + , Si + and SiOH + ions emitted from a water adsorbed Si(1 0 0) surface irradiated by a few keV Ar q+ (q = 4-8). It was found that (1) H + yield strongly depe