✦ LIBER ✦

Spontaneous formation of stacking faults in highly doped 4H–SiC during annealing

✍ Scribed by Kuhr, Thomas A.; Liu, JinQiang; Chung, Hun Jae; Skowronski, Marek; Szmulowicz, Frank

Book ID: 121849191
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 473 KB
Volume: 92
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1516250

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Stacking fault formation in highly doped

Stacking fault formation in highly doped 4H-SiC epilayers during annealing

✍ Chung, H. J.; Liu, J. Q.; Skowronski, M. 📂 Article 📅 2002 🏛 American Institute of Physics 🌐 English ⚖ 487 KB

Reducing Stacking Faults in Highly Doped

Reducing Stacking Faults in Highly Doped N-Type 4H-SiC Crystal

✍ Kojima, Kazutoshi; Kato, Tomohisa; Ito, Sachiko; Kojima, Jun; Hirose, Fusao; Kit 📂 Article 📅 2011 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 875 KB

Formation and properties of stacking fau

Formation and properties of stacking faults in nitrogen-doped 4H-SiC

✍ K. Irmscher; M. Albrecht; M. Rossberg; H.-J. Rost; D. Siche; G. Wagner 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 351 KB

A high density of double stacking faults consisting of six Si-C bilayers in cubic stacking sequence could be observed in 4H-SiC crystals with nitrogen doping concentrations exceeding 2 Â 10 19 cm À3 after annealing at temperatures above 1100 1C. The double stacking faults form by glide of two partia

Stacking faults in heavily nitrogen dope

Stacking faults in heavily nitrogen doped 4H-SiC

✍ Irmscher, K.; Doerschel, J.; Rost, H. -J.; Schulz, D.; Siche, D.; Nerding, M.; S 📂 Article 📅 2004 🏛 EDP Sciences 🌐 English ⚖ 639 KB

Growth Induced Stacking Fault Formation

Growth Induced Stacking Fault Formation in 4H-SiC

✍ Siche, D.; Albrecht, M.; Rost, H. J.; Sendzik, Andreas 📂 Article 📅 2007 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 967 KB

Thermal Annealing and Propagation of Sho

Thermal Annealing and Propagation of Shockley Stacking Faults in 4H-SiC PiN Diodes

✍ Joshua D. Caldwell; Kendrick X. Liu; Marko J. Tadjer; Orest J. Glembocki; Robert 📂 Article 📅 2007 🏛 Springer US 🌐 English ⚖ 255 KB