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Thermal Annealing and Propagation of Shockley Stacking Faults in 4H-SiC PiN Diodes

✍ Scribed by Joshua D. Caldwell; Kendrick X. Liu; Marko J. Tadjer; Orest J. Glembocki; Robert E. Stahlbush; Karl D. Hobart; Fritz Kub

Book ID: 107453554
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 255 KB
Volume: 36
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-006-0038-8

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