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Partial dislocations and stacking faults in 4H-SiC PiN diodes

✍ Scribed by M. E. Twigg; R. E. Stahlbush; M. Fatemi; S. D. Arthur; J. B. Fedison; J. B. Tucker; S. Wang

Book ID: 107453248
Publisher: Springer US
Year: 2004
Tongue: English
Weight: 762 KB
Volume: 33
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-004-0205-8

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