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Stacking-fault formation and propagation in 4H-SiC PiN diodes

✍ Scribed by R. E. Stahlbush; M. Fatemi; J. B. Fedison; S. D. Arthur; L. B. Rowland; S. Wang

Book ID: 107452758
Publisher: Springer US
Year: 2002
Tongue: English
Weight: 318 KB
Volume: 31
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-002-0085-8

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