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Planar defects in 4H-SiC PiN diodes

✍ Scribed by M. E. Twigg; R. E. Stahlbush; K. G. Irvine; J. J. Sumakeris; T. P. Chow; P. A. Lossee; L. Zhu


Book ID
107453401
Publisher
Springer US
Year
2005
Tongue
English
Weight
388 KB
Volume
34
Category
Article
ISSN
0361-5235

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