Influence of Temperature on Shockley Stacking Fault Expansion and Contraction in SiC PiN Diodes

✍ Scribed by Joshua D. Caldwell; Orest J. Glembocki; Robert E. Stahlbush; Karl D. Hobart

• Book ID: 107455046
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 397 KB
• Volume: 37
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-007-0311-5