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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratings

✍ Scribed by Buck, Thorbjörn C.; Lehmann, Peter H.; Müller, Mathias S.; Plattner, Markus; Koch, Alexander W.

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