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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry

✍ Scribed by Hlubina, P.; Lehmann, Peter H.; Ciprian, D.; Frosz, M. H.; Nielsen, K.

No coin nor oath required. For personal study only.

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