✦ LIBER ✦

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Electro-optic sensors dedicated to noninvasive electric field characterization

✍ Scribed by Warzecha, A.; Lehmann, Peter H.; Bernier, M.; Gaborit, G.; Duvillaret, L.; Lasserre, J.-L.

No coin nor oath required. For personal study only.

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