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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Non-metal elemental analysis by a compact low-energy high-repetition rate laser-induced-breakdown spectrometer

✍ Scribed by Wagner, Christian; Lehmann, Peter H.; Ewald, Johannes; Ankerhold, Georg; Kohns, Peter


Book ID
120482934
Publisher
SPIE
Year
2009
Weight
425 KB
Volume
7389
Category
Article

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