✦ LIBER ✦

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Spectral peak tracking for enhanced fiber optic sensing

✍ Scribed by Plattner, Markus P.; Lehmann, Peter H.; Brand, C. N.; Mair, T.; Schupfer, S.; Buck, T. C.; Koch, A. W.

No coin nor oath required. For personal study only.

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