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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Parallelized chromatic confocal sensor systems

✍ Scribed by Hillenbrand, Matthias; Lehmann, Peter H.; Osten, Wolfgang; Grewe, Adrian; Bichra, Mohamed; Albertazzi, Armando; Kleindienst, Roman; Lorenz, Lucia; Kirner, Raoul; Weiß, Robert; Sinzinger, Stefan

Book ID: 121510923
Publisher: SPIE
Year: 2013
Weight: 463 KB
Volume: 8788
Category: Article
DOI: 10.1117/12.2020334

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