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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - High-frequency optical fiber microphone for condition-based maintenance application

✍ Scribed by Tosi, Daniele; Lehmann, Peter H.; Osten, Wolfgang; Olivero, Massimo; Perrone, Guido; Albertazzi, Armando; Vallan, Alberto

Book ID: 121238500
Publisher: SPIE
Year: 2013
Weight: 563 KB
Volume: 8788
Category: Article
DOI: 10.1117/12.2019249

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