✦ LIBER ✦

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Interferometry of thick and thin films

✍ Scribed by Conroy, Michael; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

No coin nor oath required. For personal study only.

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