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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Real-time dual-wavelength digital holographic microscopy with a single hologram

✍ Scribed by Kühn, Jonas; Colomb, Tristan; Montfort, Frédéric; Charrière, Florian; Depeursinge, Christian; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

Book ID: 121456197
Publisher: SPIE
Year: 2007
Weight: 995 KB
Volume: 6616
Category: Article
DOI: 10.1117/12.726083

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