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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Optimized interferometer for 3D digital holographic endoscopy

✍ Scribed by Osten, Wolfgang; Kolenovic, Ervin; Klattenhoff, Reiner; Koepp, N.; Osten, Wolfgang; Kujawinska, Malgorzata; Creath, Katherine

Book ID: 121283745
Publisher: SPIE
Year: 2003
Weight: 1007 KB
Volume: 5144
Category: Article
DOI: 10.1117/12.508357

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