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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - New methods in recording and reconstruction of digital holograms

✍ Scribed by Papp, Zsolt; Kornis, Janos; Gombkoto, Balazs; Osten, Wolfgang; Kujawinska, Malgorzata; Creath, Katherine


Book ID
121283744
Publisher
SPIE
Year
2003
Weight
86 KB
Volume
5144
Category
Article

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