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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Reconstruction of in-line hologram by using iterative algorithm

✍ Scribed by Zhang, Yan; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

No coin nor oath required. For personal study only.

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