✦ LIBER ✦

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry

✍ Scribed by Gorthi, Sai Siva; Lolla, Kameswara R.; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

No coin nor oath required. For personal study only.

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