SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - A compact frequency-stabilized Nd:YVO4/KTP/I2 laser at 532 nm for laser interferometry and wavelength standards

✍ Scribed by Vitushkin, Leonid F.; Orlov, Oleg A.; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

• Book ID: 121279625
• Publisher: SPIE
• Year: 2005
• Weight: 278 KB
• Volume: 5856
• Category: Article
• DOI: 10.1117/12.611883