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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Coherent fringe projector for 3D surface profilometry

✍ Scribed by Tavares, Paulo; Viriato, Nuno; Reis, Jorge; Vaz, Mário; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.


Book ID
120610171
Publisher
SPIE
Year
2007
Weight
708 KB
Volume
6616
Category
Article

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