SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Performance of optical speckle displacement technique near-stress concentrators

✍ Scribed by Muravsky, Leonid I.; Sakharuk, Olexander M.; Kostyukevych, Sergiy O.; Maksymenko, Olexander P.; Kostyukevych, Kateryna V.; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

• Book ID: 115486415
• Publisher: SPIE
• Year: 2007
• Weight: 356 KB
• Volume: 6616
• Category: Article
• DOI: 10.1117/12.726434