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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Method of optical axis determination in crystals by use of light depolarization measurements

✍ Scribed by Domanski, Andrzej W.; Budaszewski, Daniel; Poziemski, Pawel; Wolinski, Tomasz R.; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

Book ID: 121015500
Publisher: SPIE
Year: 2007
Weight: 277 KB
Volume: 6616
Category: Article
DOI: 10.1117/12.729634

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