SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Deformation analysis in biomaterials using digital speckle interferometry

✍ Scribed by Salvador, R.; González-Peña, R.; Cibrián, R.; Buendía, M.; Mínguez, F.; Micó, V.; Carrión, J. A.; Esteve-Taboada, J. J.; Molina-Jiménez, T.; Simón, S.; Pérez, E.; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

• Book ID: 121350909
• Publisher: SPIE
• Year: 2007
• Weight: 755 KB
• Volume: 6616
• Category: Article
• DOI: 10.1117/12.726639