✦ LIBER ✦

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Speckle shear photography using photorefractive crystals for in-plane strain measurement

✍ Scribed by Majles Ara, Mohammad H.; Sirohi, Rajpal S.; Osten, Wolfgang; Kujawinska, Malgorzata; Creath, Katherine

No coin nor oath required. For personal study only.

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