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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Resolution limits and efficient signal processing for fiber optic Bragg grating sensors with direct spectroscopic detection

✍ Scribed by Miridonov, Serguei V.; Shlyagin, Mikhail G.; Spirin, Vasilii V.; Osten, Wolfgang; Kujawinska, Malgorzata; Creath, Katherine

Book ID: 121081366
Publisher: SPIE
Year: 2003
Weight: 153 KB
Volume: 5144
Category: Article
DOI: 10.1117/12.501160

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