✦ LIBER ✦

Spectroscopic ellipsometry of very thin tantalum pentoxide on Si

✍ Scribed by I. Karmakov; A. Konova; E. Atanassova; A. Paskaleva

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of very thin Ge epilaye

✍ John E. Hulse; Stephen J. Rolfe 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 427 KB

Electrical properties of amorphous tanta

✍ Oehrlein, G. S.; Reisman, A. 📂 Article 📅 1983 🏛 American Institute of Physics 🌐 English ⚖ 804 KB

Determination of optical functions of ve

✍ Sharlandjiev, P. S.; Nazarova, D. I. 📂 Article 📅 2012 🏛 Springer 🌐 English ⚖ 238 KB

Spectroscopic ellipsometry of optical tr

✍ F. Ferrieu; F. Beck; D. Dutartre 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 329 KB

Detection of thin a-Si:H antireflective

✍ Jans, J. C. ;Gemmink, J. W. 📂 Article 📅 1993 🏛 The Optical Society 🌐 English ⚖ 976 KB

Spectroscopic ellipsometry study of thin

✍ Lu, H. L.; Scarel, G.; Alia, M.; Fanciulli, M.; Ding, Shi-Jin; Zhang, David Wei 📂 Article 📅 2008 🏛 American Institute of Physics 🌐 English ⚖ 652 KB