𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Spectroscopic ellipsometry of optical transitions in thin strained Si1−xGex films

✍ Scribed by F. Ferrieu; F. Beck; D. Dutartre

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
329 KB
Volume
82
Category
Article
ISSN
0038-1098

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x