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Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

✍ Scribed by B. Karunagaran; R. T. Rajendra Kumar; C. Viswanathan; D. Mangalaraj; Sa. K. Narayandass; G. Mohan Rao

Publisher: John Wiley and Sons
Year: 2003
Tongue: English
Weight: 222 KB
Volume: 38
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.200310094

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