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Spectroscopic ellipsometry of electrochemically prepared thin film polyaniline

✍ Scribed by H.A Al-Attar; Q.H Al-Alawina; A.P Monkman

Book ID
108388633
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
219 KB
Volume
429
Category
Article
ISSN
0040-6090

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Spectroscopic ellipsometry measurements
Spectroscopic ellipsometry measurements of thin metal films
✍ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 151 KB πŸ‘ 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal