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Spectroscopic ellipsometry of metal phthalocyanine thin films

✍ Scribed by Djurišić, Aleksandra B. ;Kwong, Chung Yin ;Lau, Tsz Wai ;Liu, Zheng Tong ;Kwok, Hoi Sing ;Lam, Lillian Sze Man ;Chan, Wai Kin

Book ID
115351063
Publisher
The Optical Society
Year
2003
Tongue
English
Weight
133 KB
Volume
42
Category
Article
ISSN
1559-128X

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Spectroscopic ellipsometry measurements
Spectroscopic ellipsometry measurements of thin metal films
✍ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 151 KB 👁 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal