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Copper phthalocyanine film studied with spectroscopic ellipsometry

✍ Scribed by Donghong Gu; Qiying Chen

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
388 KB
Volume
110
Category
Article
ISSN
0030-4018

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Spectroscopic ellipsometry study of FePt
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✍ Lee, S. J. ;Lo, C. C. H. ;Yu, A. C. C. ;Fan, M. πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 317 KB

## Abstract The optical properties of a FePt nanoparticle film were investigated using spectroscopic ellipsometry. The FePt nanoparticle film of thickness about 15 nm was prepared by deposition of FePt nanoparticles directly on a Si substrate. The nanoparticle film was annealed at 600 Β°C in vacuum