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Spectroscopic Ellipsometry Studies of Indium Phthalocyanine Films

✍ Scribed by Chen, Qiying ;Gu, Donghong ;Gan, Fuxi


Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
396 KB
Volume
147
Category
Article
ISSN
0031-8965

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Spectroscopic ellipsometry study of FePt
✍ Lee, S. J. ;Lo, C. C. H. ;Yu, A. C. C. ;Fan, M. πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 317 KB

## Abstract The optical properties of a FePt nanoparticle film were investigated using spectroscopic ellipsometry. The FePt nanoparticle film of thickness about 15 nm was prepared by deposition of FePt nanoparticles directly on a Si substrate. The nanoparticle film was annealed at 600 Β°C in vacuum