𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films

✍ Scribed by Gurusamy Sridharan, Madana ;Mekaladevi, M. ;Rodriguez-Viejo, J. ;Narayandass, Sa. K. ;Mangalaraj, D. ;Chul Lee, Hee

Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
360 KB
Volume
201
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Characterization of Vacuum Evaporated Po
Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry
✍ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 376 KB πŸ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a