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Microstructure, Raman and optical studies on Cd0.6Zn0.4Te thin films

โœ Scribed by K Prabakar; S Venkatachalam; Y.L Jeyachandran; Sa.K Narayandass; D Mangalaraj


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
315 KB
Volume
107
Category
Article
ISSN
0921-5107

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Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a