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Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

โœ Scribed by M. Sridharan; M. Mekaladevi; Sa. K. Narayandass; D. Mangalaraj; Hee Chul Lee


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
168 KB
Volume
39
Category
Article
ISSN
0232-1300

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Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a