Characterization of Vacuum Evaporated Po
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M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee
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Article
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2002
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John Wiley and Sons
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English
โ 376 KB
๐ 1 views
Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a