Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a
β¦ LIBER β¦
Impedance and Electric Modulus Analysis of Cd0.6Zn0.4Te Thin Films
β Scribed by K. Prabakar; Sa. K. Narayandass; D. Mangalaraj
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 144 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0232-1300
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