๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films

โœ Scribed by M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; Hee Chul Lee

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
201 KB
Volume
38
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Characterization of Vacuum Evaporated Po
Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry
โœ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 376 KB ๐Ÿ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a

Electrooptic properties of polycrystalli
Electrooptic properties of polycrystalline SnSe thin films
โœ Prof. V. P. Bhatt; K. Gireesan; C. F. Desai ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 370 KB ๐Ÿ‘ 2 views

It is observed froni the studies of electrical resistivity of films of SnSe of different thicknesses and substrate temperatures that resistivity decreases with increase in thickness and substrate temperature. The study of variation in band gap with thickness shows a linear relationship between band