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Spectroscopic Ellipsometry and Raman Studies on Sputtered TiO2 Thin Films

✍ Scribed by Karunagaran, B.; Kim, Young Kuk; Kim, Kyung Hae; Dhungel, S.K.; Yoo, J.S.; Mangalaraj, D.; Yi, J.

No coin nor oath required. For personal study only.

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