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Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films

โœ Scribed by M. Sridharan; Sa.K. Narayandass; D. Mangalaraj; Hee Chul Lee

Book ID
117621288
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
644 KB
Volume
346
Category
Article
ISSN
0925-8388

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Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry
โœ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 376 KB ๐Ÿ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a