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Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry

โœ Scribed by M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; Hee Chul Lee

Book ID
110345977
Publisher
Springer US
Year
2002
Tongue
English
Weight
505 KB
Volume
13
Category
Article
ISSN
0957-4522

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Characterization of Vacuum Evaporated Po
Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry
โœ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 376 KB ๐Ÿ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a