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Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry

✍ Scribed by J.B. Kana Kana; J.M. Ndjaka; G. Vignaud; A. Gibaud; M. Maaza


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
745 KB
Volume
284
Category
Article
ISSN
0030-4018

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Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x